๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

High-frequency ambient noise and its impact on underwater tracking ranges

โœ Scribed by Short, J.R.

Book ID
118693873
Publisher
IEEE
Year
2005
Tongue
English
Weight
325 KB
Volume
30
Category
Article
ISSN
0364-9059

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Impact of probe-to-pad contact degradati
Impact of probe-to-pad contact degradation on the high frequency characteristics of RF MOSFETs and guidelines to avoid it
โœ E. P. Vandamme; D. Schreurs; C. van Dinther ๐Ÿ“‚ Article ๐Ÿ“… 2001 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 141 KB

Apparent degradation of the RF characteristics of silicon MOSFETs was observed under normal operating conditions. We show that it was not caused by intrinsic device degradation but originated from a degradation of the contact resistance between probe and bonding pad. Guidelines, not limited to MOSFE