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[IEEE IEEE Radio Frequency Integrated Circuits Symposium (RFIC) - Philadelphia, PA, USA (8-10 June 2003)] IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2003 - Characterization and modeling of the substrate noise and its impact on the phase noise of VCO

✍ Scribed by Huailin Liao, ; Rustagi, S.C.; Jinglin Shi, ; Yong Zhong Xiong,

Book ID: 120080375
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 229 KB
Category: Article
ISBN-13: 9780780376946
DOI: 10.1109/RFIC.2003.1213936

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