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[IEEE IEEE Radio Frequency Integrated Circuits Symposium (RFIC) - Philadelphia, PA, USA (8-10 June 2003)] IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2003 - Gate oxide breakdown on low noise and power amplifier performance

✍ Scribed by Hong Yang, ; Smith, W.; Yuan, J.S.

Book ID: 111688637
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 236 KB
Volume: 0
Category: Article
ISBN-13: 9780780376946
DOI: 10.1109/rfic.2003.1214034

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