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High depth resolution Rutherford backscattering analysis of Si–Si0.78Ge0.22/(0 0 1)Si superlattices

✍ Scribed by N.P Barradas; C Jeynes; O.A Mironov; P.J Phillips; E.H.C Parker

No coin nor oath required. For personal study only.

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High depth resolution Rutherford backscattering analysis of Si–Si0.78Ge0.22/(0&#xa0;0&#xa0;1)Si superlattices