๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

High-cycle fatigue of micron-scale polycrystalline silicon films: fracture mechanics analyses of the role of the silica/silicon interface

โœ Scribed by C.L. Muhlstein; R.O. Ritchie


Book ID
111546832
Publisher
Springer Netherlands
Year
2003
Tongue
English
Weight
396 KB
Volume
119/120
Category
Article
ISSN
1573-2673

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES