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A reaction-layer mechanism for the delayed failure of micron-scale polycrystalline silicon structural films subjected to high-cycle fatigue loading

✍ Scribed by C.L Muhlstein; E.A Stach; R.O Ritchie


Book ID
108491894
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
668 KB
Volume
50
Category
Article
ISSN
1359-6454

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