The role of debris-induced cantilever effects in cyclic fatigue of micron-scale silicon films

✍ Scribed by O. N. PIERRON; C. L. MUHLSTEIN

• Book ID: 109015212
• Publisher: John Wiley and Sons
• Year: 2007
• Tongue: English
• Weight: 156 KB
• Volume: 30
• Category: Article
• ISSN: 8756-758X
• DOI: 10.1111/j.1460-2695.2006.01042.x