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High-breakdown-voltage MESFET with a low-temperature-grown GaAs passivation layer and overlapping gate structure

✍ Scribed by Chen, C.-L.; Mahoney, L.J.; Manfra, M.J.; Smith, F.W.; Temme, D.H.; Calawa, A.R.


Book ID
120170987
Publisher
IEEE
Year
1992
Tongue
English
Weight
317 KB
Volume
13
Category
Article
ISSN
0741-3106

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