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Half-cycle atomic layer deposition reaction studies of Al2O3 on (NH4)2S passivated GaAs(100) surfaces

✍ Scribed by Milojevic, M.; Hinkle, C. L.; Aguirre-Tostado, F. S.; Kim, H. C.; Vogel, E. M.; Kim, J.; Wallace, R. M.


Book ID
111907574
Publisher
American Institute of Physics
Year
2008
Tongue
English
Weight
653 KB
Volume
93
Category
Article
ISSN
0003-6951

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Al O and SiO were deposited on BN particles with atomic layer control using alternating exposures of Al CH rH O 2 3 2 3 3 2 and SiCl rH O, respectively. The sequential surface chemistry was monitored in vacuum using transmission Fourier 4 2 Ε½ . transform infrared FTIR spectroscopy studies on high su