A series of Ni films with thickness from 0.2 monolayers (ML) to 12.5 ML were epitaxially grown on a Pd(1 0 0) substrate at room temperature. Growth and morphology were investigated by scanning tunneling microscopy (STM), reflection-high-energy-electron diffraction (RHEED) and Auger electron spectros
✦ LIBER ✦
Growth morphology of ultra-thin Ni films on Pd(1 0 0)
✍ Scribed by C. Parra; P. Häberle
- Book ID
- 108280812
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 661 KB
- Volume
- 604
- Category
- Article
- ISSN
- 0039-6028
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