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Growth defects of natural beryls observed by X-ray topography

✍ Scribed by S.S. Jiang; Q. Li; X.Y. Xu


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
820 KB
Volume
116
Category
Article
ISSN
0022-0248

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## Abstract The interference fringe caused by lattice distortion around a defect is observed in the resonant scattering X‐ray topography for the GaAs 200 reflection in the Laue case. The amplitude of the fringe can be maximized when the Fourier transform of the imaginary part of X‐ray polarizabilit