Observation of interference fringes due to lattice distortion by resonant scattering X-ray topography
✍ Scribed by Negishi, Riichirou ;Fukamachi, Tomoe ;Yoshizawa, Masami ;Hirano, Keiichi ;Kawamura, Takaaki
- Publisher
- John Wiley and Sons
- Year
- 2007
- Tongue
- English
- Weight
- 803 KB
- Volume
- 204
- Category
- Article
- ISSN
- 0031-8965
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✦ Synopsis
Abstract
The interference fringe caused by lattice distortion around a defect is observed in the resonant scattering X‐ray topography for the GaAs 200 reflection in the Laue case. The amplitude of the fringe can be maximized when the Fourier transform of the imaginary part of X‐ray polarizability χ~hi~ is zero. The fringe position relative to the defect shifts when the incident angle is varied, and the fringe spacing changes as a function of the distance from the defect. A kinematical image can be distinguished from a dynamical one by observing the image position when the incident angle is varied in the case of χ~hi~ = 0. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)