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Growth and properties of YAlO film synthesized by RF magnetron sputtering

✍ Scribed by Keiko Matsunouchi; Naoyoshi Komatsu; Chiharu Kimura; Hidemitsu Aoki; Takashi Sugino


Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
478 KB
Volume
255
Category
Article
ISSN
0169-4332

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In this work a single Langmuir probe has been used to determine in-situ the plasma electronic temperature (T e ) and the electronic density (h e ) of an rf magnetron sputtering system used to grow CN x films. Sodium chloride substrates and a carbon target (99.999%) in a mixture of Ar/N 2 were used.