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Grazing incidence X-ray study of Ge-nanoparticle formation in (Ge:SiO2)/SiO2 multilayers

✍ Scribed by K. Salamon; O. Milat; M. Buljan; U.V. Desnica; N. Radić; P. Dubček; S. Bernstorff

No coin nor oath required. For personal study only.

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