✦ LIBER ✦

Gratings for metrology and process control 2: Thin film thickness measurement; errata

✍ Scribed by Meǹdes, Geraldo F. ;Cescato, Lucila ;Frejlich, Jaime

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Gratings for metrology and process contr

✍ Mendes, Geraldo F. ;Cescato, Lucila ;Frejlich, Jaime 📂 Article 📅 1984 🏛 The Optical Society 🌐 English ⚖ 340 KB

Stress Measurements and Processing Optim

✍ Charles D.E. Lakeman; Judith A. Ruffner; Timothy J. Boyle 📂 Article 📅 1999 🏛 Springer 🌐 English ⚖ 445 KB

Novel processing of NASICON and sodium c

✍ B. J. Ward; C. C. Liu; G. W. Hunter 📂 Article 📅 2003 🏛 Springer 🌐 English ⚖ 116 KB

SPIE Proceedings [SPIE Optical Metrology

✍ Conroy, Michael; Osten, Wolfgang; Gorecki, Christophe; Novak, Erik L. 📂 Article 📅 2007 🏛 SPIE ⚖ 921 KB

427. Procedure for the measurement of th

📂 Article 📅 1966 🏛 Elsevier Science 🌐 English ⚖ 143 KB

1797. Thin film thickness measurements d

📂 Article 📅 1966 🏛 Elsevier Science 🌐 English ⚖ 130 KB