✦ LIBER ✦
427. Procedure for the measurement of thickness of transparent thin film during evaporation: K. Wohek and H J Schmidt, Z Angew Phys, 19 (2), 1965, 144–146
- Book ID
- 103455752
- Publisher
- Elsevier Science
- Year
- 1966
- Tongue
- English
- Weight
- 143 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0042-207X
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