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Grain structure of thin-film silicon by zone melting recrystallization on SiC base layer

✍ Scribed by T. Kunz; M.T. Hessmann; R. Auer; A. Bochmann; S. Christiansen; C.J. Brabec


Book ID
116630380
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
511 KB
Volume
357
Category
Article
ISSN
0022-0248

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Low frequency noise measurements and the characterization of bipolar transistors were used for the evaluation of siliconon-insulator (SOI) films obtained by zone-melting recrystallization (ZMR) and epitaxial Si layers grown on them with regard to bipolar complementary metal-oxide-semiconductor (BICM