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Ge–Sb–Te thin films deposited by pulsed laser: An ellipsometry and Raman scattering spectroscopy study

✍ Scribed by Němec, P.; Moreac, A.; Nazabal, V.; Pavlišta, M.; Přikryl, J.; Frumar, M.

Book ID
120086689
Publisher
American Institute of Physics
Year
2009
Tongue
English
Weight
567 KB
Volume
106
Category
Article
ISSN
0021-8979

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## Abstract Amorphous thin films of SnSe~2~ and Ge~2~Sb~2~Te~5~ doped by different amount of silver (0.1, 0.2, 0.5 and 1 Ag atoms per formula unit) have been prepared by pulsed laser deposition (PLD) starting from solid polycrystalline targets. The films were investigated by X‐ray diffraction (XRD)