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Structure and properties of silver doped SnSe2and Ge2Sb2Te5thin films prepared by pulsed laser deposition

✍ Scribed by Popescu, M. ;Velea, A. ;Sava, F. ;Lőrinczi, A. ;Tomescu, A. ;Simion, C. ;Matei, E. ;Socol, G. ;Mihailescu, I. N. ;Andonie, A. ;Stamatin, I.


Publisher
John Wiley and Sons
Year
2010
Tongue
English
Weight
608 KB
Volume
207
Category
Article
ISSN
0031-8965

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✦ Synopsis


Abstract

Amorphous thin films of SnSe~2~ and Ge~2~Sb~2~Te~5~ doped by different amount of silver (0.1, 0.2, 0.5 and 1 Ag atoms per formula unit) have been prepared by pulsed laser deposition (PLD) starting from solid polycrystalline targets. The films were investigated by X‐ray diffraction (XRD), differential scanning calorimetry (DSC), scanning electron microscopy (SEM) and atomic force microscopy (AFM). The good gas sensing properties for CO, as well as the sensitivity for CH~4~ and NO of the Ag doped SnSe~2~ films have been demonstrated in the composition SnSe~2~Ag~0.2~. The structural effect of silver introduced in Ge~2~Sb~2~Te~5~ matrix has been investigated. The freshly deposited thin films doped by various amount of Ag develop three phases: an amorphous one, and two crystalline phases consisting of a major fcc cubic phase of AgSbTe~2~ and a minor cubic phase of composition Ag~2~Te.


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