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Gate Voltage Dependence of MOSFET $\hbox{1}/f$ Noise Statistics

✍ Scribed by Erturk, M.; Tian Xia, ; Clark, W.F.


Book ID
121850623
Publisher
IEEE
Year
2007
Tongue
English
Weight
145 KB
Volume
28
Category
Article
ISSN
0741-3106

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