Dependence of Generation–Recombination Noise With Gate Voltage in FD SOI MOSFETs

✍ Scribed by Luque Rodriguez, Abraham; Jimenez Tejada, Juan A.; Rodriguez-Bolivar, Salvador; Mendes Almeida, Luciano; Aoulaiche, Marc; Claeys, Cor; Simoen, Eddy

• Book ID: 126255157
• Publisher: IEEE
• Year: 2012
• Tongue: English
• Weight: 837 KB
• Volume: 59
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/TED.2012.2208970