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Gate Bias Stresses of Gate-All-Around Poly-Si TFTs With Multiple Nanowire Channels

✍ Scribed by Kang, T.-K.; Liao, T.-C.; Wang, C.-K.

Book ID: 114621004
Publisher: IEEE
Year: 2012
Tongue: English
Weight: 1024 KB
Volume: 59
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2012.2197213

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