A Novel Charge-Trapping-Type Memory With Gate-All-Around Poly-Si Nanowire and HfAlO Trapping Layer

✍ Scribed by Lee, Ko-Hui; Lin, Horng-Chih; Huang, Tiao-Yuan

• Book ID: 120569835
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 656 KB
• Volume: 34
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/LED.2013.2237748