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Gas ion source for focused beams

✍ Scribed by J.E. Barth; C.B. de Gruyter; E. Koets; P. Kruit; P.E. van der Leeden; J.B. Le Poole; K.D. van der Mast


Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
69 KB
Volume
3
Category
Article
ISSN
0167-9317

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Focused ion beams techniques for nanomat
✍ Richard M. Langford πŸ“‚ Article πŸ“… 2006 πŸ› John Wiley and Sons 🌐 English βš– 483 KB

## Abstract Focused ion beam and dual platform systems have, over the last 10 years, become a main stay of sample preparation for material analysis. In this article the merits of using these systems are discussed and the three main techniques used to prepare cross‐section specimens for transmission