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Functional Constraints vs. Test Compression in Scan-Based Delay Testing

✍ Scribed by Ilia Polian; Hideo Fujiwara

Book ID: 106384339
Publisher: Springer US
Year: 2007
Tongue: English
Weight: 264 KB
Volume: 23
Category: Article
ISSN: 0923-8174
DOI: 10.1007/s10836-007-5013-7

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