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[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Virtual Circuit Model for Low Power Scan Testing in Linear Decompressor-Based Compression Environment

✍ Scribed by Chen, Zhen; Li, Jia; Xiang, Dong; Huang, Yu

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