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[IEEE 2009 Design, Automation & Test in Europe Conference & Exhibition (DATE'09) - Nice (2009.04.20-2009.04.24)] 2009 Design, Automation & Test in Europe Conference & Exhibition - A generic framework for scan capture power reduction in fixed-length symbol-based test compression environment

✍ Scribed by Xiao Liu, ; Qiang Xu,

Book ID: 120196552
Publisher: IEEE
Year: 2009
Weight: 129 KB
Category: Article
ISBN: 3981080157
DOI: 10.1109/DATE.2009.5090899

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