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[IEEE 2010 5th International Design and Test Workshop (IDT) - Abu Dhabi, United Arab Emirates (2010.12.14-2010.12.15)] 2010 5th International Design and Test Workshop - Cost-free low-power test in compression-based reconfigurable scan designs

✍ Scribed by Almukhaizim, Sobeeh; Mohammad, Mohammad; AlQuraishi, Eman

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