𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2010 5th International Design and Test Workshop (IDT) - Abu Dhabi, United Arab Emirates (2010.12.14-2010.12.15)] 2010 5th International Design and Test Workshop - SAT-based ATPG for reversible circuits

✍ Scribed by Zhang, Hongyan; Wille, Robert; Drechsler, Rolf

Book ID: 124167585
Publisher: IEEE
Year: 2010
Weight: 640 KB
Category: Article
ISBN: 1612842917
DOI: 10.1109/IDT.2010.5724428

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2010 5th International Design and

[IEEE 2010 5th International Design and Test Workshop (IDT) - Abu Dhabi, United Arab Emirates (2010.12.14-2010.12.15)] 2010 5th International Design and Test Workshop - Cost-free low-power test in compression-based reconfigurable scan designs

✍ Almukhaizim, Sobeeh; Mohammad, Mohammad; AlQuraishi, Eman 📂 Article 📅 2010 🏛 IEEE ⚖ 513 KB

[IEEE 2010 5th International Design and

[IEEE 2010 5th International Design and Test Workshop (IDT) - Abu Dhabi, United Arab Emirates (2010.12.14-2010.12.15)] 2010 5th International Design and Test Workshop - Design and implementation of low latency network interface for network on chip

✍ Attia, Brahim; Chouchene, Wissem; Zitouni, Abdelkrim; Nourdin, Abid; Tourki, Rac 📂 Article 📅 2010 🏛 IEEE ⚖ 644 KB

[IEEE 2010 5th International Design and

[IEEE 2010 5th International Design and Test Workshop (IDT) - Abu Dhabi, United Arab Emirates (2010.12.14-2010.12.15)] 2010 5th International Design and Test Workshop - Prediction performance method for dynamic task scheduling, case study: the OLLAF Architecture

✍ Ktata, Ismail; Ghaffari, Fakhreddine; Granado, Bertrand; Abid, Mohamed 📂 Article 📅 2010 🏛 IEEE ⚖ 623 KB

[IEEE 2010 5th International Design and

[IEEE 2010 5th International Design and Test Workshop (IDT) - Abu Dhabi, United Arab Emirates (2010.12.14-2010.12.15)] 2010 5th International Design and Test Workshop - Area efficient-high throughput sub-pipelined design of the AES in CMOS 180nm

✍ Alma'aitah, A.; Abid, Zine-Eddine 📂 Article 📅 2010 🏛 IEEE ⚖ 638 KB

[IEEE 2010 11th International Workshop o

[IEEE 2010 11th International Workshop on Microprocessor Test and Verification (MTV) - Austin, Texas, USA (2010.12.13-2010.12.15)] 2010 11th International Workshop on Microprocessor Test and Verification - Automatic Fault Localization for SystemC TLM Designs

✍ Le, Hoang M.; Große, Daniel; Drechsler, Rolf 📂 Article 📅 2010 🏛 IEEE ⚖ 214 KB

[IEEE 2010 12th International Workshop o

[IEEE 2010 12th International Workshop on Cellular Nanoscale Networks and their Applications (CNNA 2010) - Berkeley, CA, USA (2010.02.3-2010.02.5)] 2010 12th International Workshop on Cellular Nanoscale Networks and their Applications (CNNA 2010) - Digital Micromirror Device (DMD) projector based test bench for vision chips

✍ Gergelyi, Domonkos; Foldesy, Peter 📂 Article 📅 2010 🏛 IEEE ⚖ 724 KB