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[IEEE 2010 5th International Design and Test Workshop (IDT) - Abu Dhabi, United Arab Emirates (2010.12.14-2010.12.15)] 2010 5th International Design and Test Workshop - Area efficient-high throughput sub-pipelined design of the AES in CMOS 180nm

✍ Scribed by Alma'aitah, A.; Abid, Zine-Eddine

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