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Full composition range silicon oxynitride films deposited by ECR-PECVD at room temperature

✍ Scribed by A. del Prado; I. Mártil; M. Fernández; G. González-Díaz


Book ID
114086749
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
383 KB
Volume
343-344
Category
Article
ISSN
0040-6090

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