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Free radical fast photo-cured gate dielectric for top-gate polymer field effect transistors

✍ Scribed by Zied Fahem; Wolfgang Bauhofer

Book ID: 113834528
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 275 KB
Volume: 13
Category: Article
ISSN: 1566-1199
DOI: 10.1016/j.orgel.2012.04.011

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