๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Formation of the Schottky barrier at the Pd/Si interface

โœ Scribed by R.J. Purtell; P.S. Ho; G.W. Rubloff; P.E. Schmid


Publisher
Elsevier Science
Year
1983
Weight
220 KB
Volume
117-118
Category
Article
ISSN
0378-4363

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Characterization of interface states at
โœ P. P. Sahay; Prof. R. S. Srivastava ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 322 KB

## Characterization of Interface States at Ni/n-Si Schottky Barriers from Z -V Characteristics Experiments were performed on Ni/n-Si(l1 1) Schottky diodes fabricated by the thermal vacuum deposition of nickel on n/n+ Si epitaxial wafer attorr pressure. The non-equilibrium occupation functions of t