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Soft X-ray photoemission measurement of Schottky barrier formation at the PdSi interface

✍ Scribed by R. Purtell; P.S. Ho; G.W. Rubloff; G. Holinger


Publisher
Elsevier Science
Year
1983
Tongue
English
Weight
51 KB
Volume
104
Category
Article
ISSN
0040-6090

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