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X-ray and ultraviolet photoemission study of the formation and band lineup of C60/Si(111) interface

✍ Scribed by Zhu Jing-Sheng; Liu Xian-Ming; Xu Shi-Hong; Wu Jian-Xin; Sun Xue-Feng

Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
222 KB
Volume
98
Category
Article
ISSN
0038-1098

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A combined UPS and XPS study was performed on a series of structurally related vanadium sulfides of the NiAs type. The valence band spectra show systematic variations with the metal to sulfur ratio ( 1.0 to 1.6\()\) such as an increase in the density of states with increasing sulfur content. These f