X-ray scattering from surfaces and interfaces and its application to the characterization of CaF2Si(111) interfaces

✍ Scribed by J. Harada; I. Takahashi; Y. Itoh; N.S. Sokolov; N.L. Yakovlev; Y. Shusterman; J.C. Alvarez

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 734 KB
• Volume: 163
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/0022-0248(95)01035-1