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A study of the electronic structure and Schottky barriers at reconstructed Sn/Si interfaces

✍ Scribed by H.T. Anyele; A.A. Cafolla; C.C. Matthai

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 332 KB
Volume: 70-71
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(93)90555-p

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