๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Formation of rhodium silicide by rapid thermal annealing and by ion beam mixing

โœ Scribed by E.P. Burte; G. Neuner


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
766 KB
Volume
53
Category
Article
ISSN
0169-4332

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๐Ÿ“œ SIMILAR VOLUMES


Mixing and Silicide Formation during Xe-
โœ S. Dhar; M. Milosavljevic; N. Bibic; K.P. Lieb ๐Ÿ“‚ Article ๐Ÿ“… 2000 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 128 KB

Dedicated to Professor Dr. Wolfgang Schro รˆ ter on the occasion of his 65th anniversary Thin Ta layers deposited on Si (100) substrates were irradiated with 475 keV Xe ions to fluences of (0.5ยฑ2) ร‚ 10 16 ions/cm 2 at temperatures between room temperature and 400 C. By means of Rutherford Backscatter