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Flying-spot scanning for the separate mapping of resistivity and minority-carrier lifetime in silicon

✍ Scribed by H. Bleichner; E. Nordlander; G. Fiedler; P.A. Tove

Book ID: 107856826
Publisher: Elsevier Science
Year: 1986
Tongue: English
Weight: 687 KB
Volume: 29
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(86)90179-6

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