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Oxygen precipitate precursors and size thresholds for the preferential nucleation for copper and nickel precipitation in silicon: the detection of copper and nickel contamination by minority carrier lifetime methods
✍ Scribed by A. Bazzali; G. Borionetti; R. Orizio; D. Gambaro; R. Falster
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 529 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0921-5107
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