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Flux creep in YBa2Cu307-y epitaxial film

✍ Scribed by J. Sha; J.Z. Shi; Z.H. He; W.Z. Shi; X.H. Chen; N.L. Wang; X.A. Cheng; Z.P. Su; L.Z. Cao; ZH. Qi; Q.R. Zhang


Book ID
104356293
Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
333 KB
Volume
165-166
Category
Article
ISSN
0921-4526

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A systematic study of the flux creep behavior has been carried out for c-axis oriented epitaxial YBa2Cu307 thin films based on the Anderson and Kim flux creep model. In a wide magnetic field (H) range (0 to 12 T) and temperature (T) range ( 10 to 82 K), the behavior of the critical current density J

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