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Flexoelectricity induced increase of critical thickness in epitaxial ferroelectric thin films

✍ Scribed by Hao Zhou; Jiawang Hong; Yihui Zhang; Faxin Li; Yongmao Pei; Daining Fang

Book ID: 116834040
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 724 KB
Volume: 407
Category: Article
ISSN: 0921-4526
DOI: 10.1016/j.physb.2012.04.041

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