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Size Effects of the Critical Temperature in Ferroelectric Thin Films

โœ Scribed by Zhan-Ning, Hu; Lo, V.C


Book ID
115537813
Publisher
IOP Publishing
Year
2007
Tongue
English
Weight
259 KB
Volume
48
Category
Article
ISSN
0253-6102

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โœ G.L. Yuan; J.-M. Liu; K. Baba-Kishi; H.L.W. Chan; C.L. Choy; D. Wu ๐Ÿ“‚ Article ๐Ÿ“… 2005 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 131 KB

We study the switching fatigue behaviors of ferroelectric layered-perovskite oxide films, including SrBi 2 Ta 2 O 9 , Bi 3.15 Nd 0.85 Ti 3 O 12 and Bi 3.25 La 0.75 Ti 3 O 12 deposited on Pt/TiO 2 /SiO 2 /Si substrates, at various temperatures. It is found that the damaged ferroelectric polarization