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Solution for the critical thickness models of dislocation generation in epitaxial thin films using the LambertWfunction

✍ Scribed by Chokri Hadj Belgacem; Mustapha Fnaiech

Publisher: Springer
Year: 2010
Tongue: English
Weight: 225 KB
Volume: 46
Category: Article
ISSN: 0022-2461
DOI: 10.1007/s10853-010-5026-y

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