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Field strength degradation in Si-SiO/SUB 2/-polycrystalline Si structures

✍ Scribed by Mattauch, R.J.; Howle, W.M.

Book ID: 119797543
Publisher: IEEE
Year: 1976
Tongue: English
Weight: 401 KB
Volume: 11
Category: Article
ISSN: 0018-9200
DOI: 10.1109/jssc.1976.1050806

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