𝔖 Bobbio Scriptorium

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Fault detection and design complexity in C-testable VLSI arrays

✍ Scribed by Lombardi, F.; Huang, W.

Book ID: 119772733
Publisher: IEEE
Year: 1990
Tongue: English
Weight: 531 KB
Volume: 39
Category: Article
ISSN: 0018-9340
DOI: 10.1109/12.61070

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