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Fabrication of high quality SiGe relaxed thin layers by ion implantation technique with Ar, Si and Ge ions

โœ Scribed by K. Sawano; A. Fukumoto; Y. Hoshi; J. Yamanaka; K. Nakagawa; Y. Shiraki


Book ID
108290200
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
325 KB
Volume
517
Category
Article
ISSN
0040-6090

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