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Extraction of the lateral distribution of interface traps in MOSFETs by a novel combined gated-diode technique

✍ Scribed by Jin He; Xing Zhang; Ru Huang; Yangyuan Wang

Book ID: 108361883
Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 203 KB
Volume: 41
Category: Article
ISSN: 0026-2714
DOI: 10.1016/s0026-2714(01)00235-9

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