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Experimental investigation of the impact of LWR on sub-100-nm device performance

โœ Scribed by Hyun-Woo Kim; Ji-Young Lee; Shin, J.; Sang-Gyun Woo; Han-Ku Cho; Joo-Tae Moon


Book ID
114617648
Publisher
IEEE
Year
2004
Tongue
English
Weight
714 KB
Volume
51
Category
Article
ISSN
0018-9383

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