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Experimental Investigation of RF Noise Performance Improvement in Graded-Channel MOSFETs

✍ Scribed by Emam, M.; Sakalas, P.; Vanhoenacker-Janvier, D.; Raskin, J.-P.; Tao Chuan Lim; Danneville, F.

Book ID: 114619653
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 853 KB
Volume: 56
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2009.2021361

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